Example 9: MBE Magnetic Multilayers/Scanning Probe Microscopy

This system is a customised multi-chamber UHV system for the growth and investigation of thin layered materials.

MBE System for Preparation and Investigation of Thin Layer Materials

This system is a customised multi-chamber UHV system for the growth and investigation of thin layered materials.

Custom MBE System Magnetic Multilayers Modules

MBE Description Description

Multi chamber UHV system dedicated to preparation of thin layers and complex analysis of surface solid samples (crystallographic and electron structure) with scanning probe microscopy (SPM) and other research methods. The MBE chamber is equipped with 7 sources, RHEED and Ion Source. The analysis chamber is equipped with XPS analyser working with X-ray, Ion and Electron Sources.

Custom MBE System Magnetic Multilayers Internal

Specification
The system is dedicated for:

Generating nanostructures, thin layers, magnetic laminar structures and heterostructures (ferromagnetic/semiconductor) by epitaxial growth

Advanced research into characteristics of fabricated heterostructures using magnetic, XPS and SPM methods.

Characterisation of magnetic thin layers and magnetic solid materials via STM, AFM and magnetic force microscopy (MFM)

Measurement of surface electron state density of thin layers and magnetic heterostructures

Analysis of surface electron states by X-ray photoelectron spectroscopy (XPS)

Our 16 page catalogue provides additional examples and is available for download here.