Ion Source for Sample Cleaning
Ion Source for Sample Cleaning IS40C1
The Ion Source IS40C1 is a compact, easy-to-use extractor type ion gun for sample surface cleaning.
The source generates an ion current of >70 μA/cm2 (Argon) with Gaussian beam profile. The source insertion length is adaptable to individual requirements (between 62.5 mm - 384.5 mm, other on request).
Ion Source Power Supply IS40-PS C1 mode
The IS40-PS power supply drives the IS40C1 Ion Source which is used for broad area UHV sample cleaning and preparation.
The IS40-PS power supply allows fine adjustment of both beam energy and ion density via digital encoders. All settings can be stored and recalled automatically after unit switch on, or else manually adjusted. The unit also features a built in timer and automatic standby mode.
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